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International News: Critical li nk to Present Two Technical Presentations at Inaugural em bedded Technologies Expo & Conference #19059
Posted by: smithmillermoore
City: Syracuse
State: NY
Postal code: 13211
Country: United States
Contact Person: Marlene Moore
Telephone: 8187081704
Company: Critical li nk
Website URL: www.criticalli nk.com
Contact Email: info@criticalli nk.com

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News Article:
• Company will present two technical sessions on em bedded imaging solutions at the em bedded Technologies Expo & Conference, McEnery Convention Center, San Jose, California, while showcasing its award-winning systems, boards, and platforms in Booth #1835, June 25-27, 2019.

Syracuse, N. Y. – May 29, 2019 – Critical li nk, a leading provider of electronics and engineering services for industrial em bedded applications, will present two technical sessions and showcase its latest board-level em bedded imaging solutions at the inaugural em bedded Technologies Expo & Conference (ETC), McEnery Convention Center, San Jose, California, from June 25-27, 2019. The expo will be co-located with the Sensors Expo & Conference, the largest of its kind in North America.

“We're excited to be part of the first em bedded Technologies Expo & Conference,” said Amber Thousand, director of marketing. “The co-location with the popular Sensors Expo represents a sweet spot for Critical li nk's em bedded imaging solutions.”

Critical li nk's technical presentations are part of the “Vision & Imaging for Industrial Applications” track of the conference program. On Thursday, June 27 at 10:00 a.m, co-founder and vice president of imaging applications, Omar Rahim, will present “Using Linux with FPGA Co-Processing for Real-Time em bedded Vision”. Following at 11:25 a.m., Dave Rice, co-founder and technical director, will give a talk enti tled “Optimizing Industrial Imaging Development.” Conference registration is required for both sessions which will take place in room 203A.




Critical li nk's System on Modules (SOMs) and em bedded imaging platforms are designed for next-generation performance in a variety of scientific, industrial, medical, and defense applications to ensure a faster time to market, lower development costs, and long-term availability. Products on display at ETC will include:

• MityCAM-C50000 imaging system. Specially designed as an evaluation platform for the CMV50000 high-speed image sensor from ams / CMOSIS. The global shutter sensor features 47.5MP resolution at 30 fr ames per second, mono and RGB color options, with low dark noise and high dynamic range. The innovative system provides multiple interfaces including USB3 as standard, with custom options that include CoaXPress, Camera li nk, GigE, and more.

• MitySOM-A10S system on module (SOM) and image processing board. This family features dual core Cortex-A9 ARMs with up to 480KLE user-programmable FPGA fabric, DDR4 memory, and 12 high-speed transceiver pairs, making it an ideal solution for machine vision and scientific imaging applications. The board is available in two configurations: first as a stack-through board for use in camera designs, and second with bottom-side, rugged board-to-board connectors for integration with an industrial ba seboard.

The MityCAM-C50000 and the MitySOM-A10S are readily available from Critical li nk and select partners. To see a demonstration of these remarkable new em bedded imaging solutions, please visit Booth #1835 at the em bedded Technologies Expo & Conference, McEnery Convention Center, San Jose, California, June 25-27, 2019.. For more information, please go to www.criticalli nk.com or email us at info@criticalli nk.com.


About Critical li nk
Syracuse, N.Y.-ba sed Critical li nk (www.criticalli nk.com) is an em bedded systems engineering firm offering customizable system-on-modules (SOMs) and imaging platforms for industrial, medical, scientific, and defense applications. Critical li nk's end-to-end product engineering services include design, development, and production. Critical li nk is a premier Partner in the Imaginghub by Basler, a Platinum Member of the Intel (Altera) FPGA Design Solutions Network and the Intel IoT Solutions Alliance, and is ISO 9001:2015 Registered by SRI Quality System Registrar.

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Critical li nk, LLC
6712 Brooklawn Parkway
Syracuse, NY 13211
Contact: Amber Thousand,
Director of Marketing
Phone: 315-425-4045
Fax: 315-425-4048
E-mail: info@criticalli nk.com
Web Site: www.criticalli nk.com

Submitted by Media Contact: Marlene Moore
Smith Miller Moore
Phone: 818-708-1704
www.smithmillermoore.com




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